Chamber ComponentShield Room

Shield Room

14kHz – 40GHz대역까지의 전기 및 전파관련 노이즈 유입/유출을 차단하여 안전하고 적합한 시험환경을 제공합니다.

NSA measurement set

PLA-SET for Site Validation - Radiofrequency Engineering - Seibersdorf Laboratories RF

Normalized Site Attenuation (NSA) measurement at 3 m, 5 m and 10 m distance is convenient due to sufficient dynamic range, all required documentation and calibration. Setup and alignment is easy with the integrated tripod and laser system. A decoupling unit to avoid ground loops is included.
Shielding Effectiveness (SE) can be measured with a high dynamic. No external power amplifier or low noise preamplifier is required.

Tissue Simulating Liquids

Tissue Simulating Liquids

SAR(전자파 흡수율) 측정시 모의인체 안에 들어가는 용액으로써 사람의 뇌 혹은 신체와 같은 전기적인 특성을 갖도록 물질을 말합니다.

Magnetic Field Emission Test System

Magnetic Field Emission Test System

EMP Protection

EMP Protection Shielded Rack

GTEM / TEM Cells / Striplines / Reverberation Chambers

TEM Cells

The transversal electromagnetic mode which can be developed in the DTEM cell, provides the opportunity for EMC testing inside the cell.

GTEM / TEM Cells / Striplines / Reverberation Chambers

Reverberation Chambers / Stirrers

Reverberation Chambers (RCs) are modern EMC test environments in addition to the established methods like semi- or full anechoic rooms, open area test sites or GTEM cells. They can be used for emissions and immunity testing.

RF Power Amplifier

CBA6G D Series

Class A, high power density, design has allowed us to produce a 1.0 GHz to 6 GHz amplifier series with power levels from 30 to 400 watts P1dB. These amplifiers are ideal for RF immunity testing in a GTEM Cell or with a wide range of available horn antenna such as the Teseq BHA range or readily integrated with an NSG 6000 to form part of a broadband RF test system. The touch screen colour display gives an immediate visual indication of forward and reverse power along with the current operating status of the amplifier and access to diagnostic information such as gate current and heatsink temperature. Fan speed adjusts depending on the heatsink temperature thus ensuring the minimum audio noise level possible in the operating environment. The inbuilt calibrated forward power coupler provides a quick and easy way to monitor forward power with any power meter. Input overdrive protection prevents damage to the input devices due to accidental high input power. Multiple remote interfaces are available as standard including USB, GPIB, RS232, and Ethernet.

Transient Test SystemAutomotive

NSG 5500

The compact and modular NSG 5500 solution offers the generators necessary for tests with capacitive discharge pulsed interference as called for by ISO, SAE, DIN and JASO, and others. The established test specifications for passenger cars together with the new standards for commercial vehicles published by these international and other bodies are fully covered, as are the most company-specific standards from vehicle manufacturers. Based on our exclusive Gemini technology, Teseq offers the most flexible and upgradeable system to protect the users’ investment. NSG 5500 system. This compact mainframe houses the common system components and accommodates the standard pulse generators. All testing is available from one output connector. An electronic switch to connect and disconnect the battery supply is in-corporated in the NSG 5500. Additional inputs and outputs are located on the rear panel for test execution control purposes and the monitoring of error signals, oscilloscope triggers, gate start/stop commands, etc. Overall control is via a PC running AutoStar™ under Windows.

Transient Test SystemCommercial

NSG 3060A models

Teseq’s new NSG 3060A conducted immunity generator takes the proven, user-friendly design of the highly successful NSG 3000 series to a new level. This innovative design uses modular architecture to provide a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories. Designed to fulfill requirements for CE mark and ANSI C62.41 testing, the NSG 3060A performs tests for Combination wave surge, Ring wave and Electrical Fast Transient (EFT) pulses as well as Power Quality Testing (PQT). Extensive expansion capabilities enable the system to be configured for a much broader range of applications. Using state of the art components, the self-contained modules set new standards with respect to switching and phase accuracy and exceed the existing standards’ requirements. With its powerful processors, the NSG 3060A can completely fulfill the unique coupling requirements specified by ANSI C62.41. This standard requires that the pulse amplitude be adjusted for the phase position of the pulse on the AC mains, and for the amplitude of the mains voltage. A 7” touch panel display with superb contrast and color is the most striking feature of the new NSG 3060A. For fast and efficient data entry, input devices include an integrated keyboard and a thumbwheel with additional keys for sensitivity adjustment. The user-friendly graphic display speeds test setup. Each parameter’s value is highly visible, and all settings can be quickly selected and modified with the generously sized touch input buttons. A stylus is not necessary, and ramp functions are programmed quickly and easily. Multi-step test procedures can be created and their sequence or parameter values changed easily. The users can make manual parameter changes using the thumbwheel while a test is under way, providing an effective and fast method for identifying critical threshold values. The Test Assistance (TA) function allows users to initiate standardized test with just a few “clicks” to achieve quick, reliable results in a development environment. The NSG 3060A has an Ethernet port for external PC control. The Windows-based control software simplifyes test programming and allows compilation of complex test sequences with diverse pulse types. Test reports can be generated during the test operation, allowing the operator to enter observations as the test progresses and increasing the efficiency of long-term tests.